|About this Abstract
||Materials Science & Technology 2020
||Sintering and Related Powder Processing Science and Technologies
||Grain Growth Measurements of Anti-thermal Strontium Titanate with Non-destructive High Energy X-ray Diffraction Microscopy (HEDM)
||Amanda Krause, He Liu, Christopher J Marvel, Bryan Conry, Michael Hoffmann, Robert Suter, Carl E Krill, Martin P Harmer
|On-Site Speaker (Planned)
Strontium titanate (SrTiO3) exhibits anti-thermal grain growth between 1350°C and 1425°C, where the grain boundary mobility decreases as the temperature increases. The underlying mechanism for this rare grain growth behavior is unknown. Previous grain growth studies show a change in the grain boundary character distribution within this temperature range. However, conventional grain growth studies rely on statistical comparisons of grain size distributions to describe grain growth and cannot capture the migration of individual grain boundaries or those of a specific energy or character. Here, the non-destructive microstructural characterization method high-energy x-ray diffraction microscopy (HEDM) is employed to directly correlate the velocity and character of individual SrTiO3 grain boundaries to elucidate anti-thermal behavior. Initial observations and the grain boundary velocity measurements at 1350°C (thermal regime) and 1400°C (anti-thermal regime) will be discussed.