ProgramMaster Logo
Conference Tools for 2025 TMS Annual Meeting & Exhibition
Login
Register as a New User
Help
Submit An Abstract
Propose A Symposium
Presenter/Author Tools
Organizer/Editor Tools
About this Symposium
Meeting 2025 TMS Annual Meeting & Exhibition
Symposium Electronic Packaging and Interconnection Materials II
Sponsorship TMS Functional Materials Division
TMS: Electronic Packaging and Interconnection Materials Committee
Organizer(s) C. Robert Kao, National Taiwan University
Yu-An Shen, Feng Chia University
Christopher M. Gourlay, Imperial College London
Fan-Yi Ouyang, National Tsing Hua University
Hiroshi Nishikawa, Osaka University
Hannah Fowler, Sandia National Laboratories
Kazuhiro Nogita, University of Queensland
Praveen Kumar, Indian Institute of Science
Tae-Kyu Lee, Cisco Systems
Yan Li, Samsung Semiconductor Inc.
Scope Continuing advances in microelectronic, opto-electronic and nano-electronic devices require new materials and technologies to meet the increasing electrical, thermal, mechanical, reliability, performance and environmental demands placed on interconnects and packaging at all levels. This symposium will address current research in packaging materials and processes, including Pb free solders, Ag and Cu sintering, hybrid bonding, conductive adhesives, epoxy, substrates, 3D packaging, wafer level packaging, quality, reliability, and failure analysis.

Topics of interest include, but are not limited to:

* Packaging materials and processes for next generation packages, e.g., 3D packaging, wafer level packaging, photonic packaging, Internet of Things (IoT), flexible electronics, wire bonding, automotive and power electronics.
* Interconnects for packages, e.g., Pb-free solder, micro bumps, Through-silicon-vias (TSVs), direct Cu to Cu bonding, wire bonding, conductive adhesive, optoelectronic interconnects, transient liquid phase bonding, sintered nano-powder joints, polymer core solder balls and alternative interconnect materials at chip and package levels.
*Additive manufacturing and 3D printing for electronics industry
* Other packaging materials e.g., epoxy, molding compounds, epoxy flux, thermal interface material (TIM), substrate materials and process.
* Quality, Reliability, and failure analysis for next generation packages.
* Continuing challenges in implementing Pb-free solders for interconnections, plating and thermal interface material (TIM) applications
* Developments in high temperature Pb-free solders and associated interconnects for automotive and power electronics
* Developments in low temperature Pb-free solder alloys and fine pitch solder joints
* Electromigration, thermomigration, stress-migration and mechanical effects
* Whisker growth in Sn, Sn-based alloys and other metallic systems
* Advanced characterization methods as applied to interconnect technology
* Fundamental material behavior including phase transformations, computational thermodynamics, solidification, microstructure evolution, micromechanics, corrosion, mechanical, thermal, and electrical properties of solders and intermetallic compounds

Abstracts Due 07/15/2024
Proceedings Plan Planned:
PRESENTATIONS APPROVED FOR THIS SYMPOSIUM INCLUDE

The Effect of grain size on the chemical-mechanical-planarization Removal Rate of Cu Films
A New Method for High Precision Work of Adhesion Measurements of Micron-scale Copper Bonds
A Study on Novel Thermal Interface Composite Indium-based/Diamond Composite for High-Performance Computing Applications
Advanced Thermal Management in Electronics: Micro-Nano Copper Forest Wicks for Thin Vapor Chambers
Advanced Vapor Chamber with Enhanced Hierarchical Dendritic Wick Structure for High-power-devices
Advancing Reliability in Low-Temperature Solders Using Hybrid SAC/SnBi Alloys
Ag-nodule mediated bonding with Ag-Si metastable phase
Assessment of Solder Alloy for High Reliability Device
Blind hole filling with nano-twinned copper in bulid up pcbs
Characterization of FCQFN Solder Interconnects Incorporating Ni Metallization for Advanced High-power Automobile Applications: An Electromigration Study
Comparative Research on Reliability Characteristics of Combined Pb-free Solder Joints with Sn-Ag-Cu and Sn-Bi-Ag
Comparison between current induced Joule heat variation on near eutectic and off eutectic Sn-Bi solder joint stability
Crystallographic aspects of phase transformations in Sn-58Bi low temperature solder
Designing Mechanically Resilient Thermal Interface Materials
Developing High-Reliability Solder Alloys for Automotive Electronics
Effect of In and Zn Addition on the Interfacial Reaction of Sn-Bi/Cu Solder Joints
Electrical Current-Induced Phase Transformation and Enhanced Mechanical Properties in η'-Cu6Sn5 for Electronic Solder Joints
Electrochemical migration behavior and its improvement of fine-pitch Ag interconnects
Electroless Plated Highly (111) Nanotwinned Cu-to-Cu Direct Bonding
Electromigration behavior of direct-bonded nano-twinned Ag-Cu bumps
Electromigration Failure Mechanisms and Microstructural Changes of Silver Sintered Joints Under Different Bonding Thickness
Enhancement of Strength and Aging Resistance in Sn-9Zn Alloys with Minor Bi Addition
Enhancing Low-Temperature Solder Reliability with Hybrid SAC/SnBi Systems
Impact of cryogenic thermal cycling on solder interconnect mechanical stability
Impact of temperature gradient on the growth of intermetallic compounds in solid-state Cu and In-solder system
Indentation rate response to enable property mapping in multiphase solders
Influence of Minor Alloying Elements on the Properties of Sn-Bi Alloys
Influence of the Bi phase distribution on the electrical and thermal properties of Sn-Bi Alloys
Innovative graphene coated Cu powder for sintering in air atmosphere
Inspection, Estimation, and Design of Hybrid Bonding Processes Using In-situ Heating Atomic Force Microscopy
Interconnect-based Sensor Array for Characterizing Thermal Management of IC Chips
Investigation of Electroless Ag-Passivated Cu-to-Cu Direct Bonding and micro Cu pillar bonding
Investigation of Electromigration Lifetime for Cu-Cu Joints with Various Microstructures
Investigation of SiCN-SiCN bonding with different wet pretreatment solutions for Cu hybrid bonding applications
Low temperature Cu-Cu direct bonding in air ambient by ultrafast surface grain growth
Low vacuum bonding using nano-twinned Silver and SiO2 for Heterogeneous integration
Microstructural analysis and mechanical properties evaluation of zinc-coated aluminum particles
Microstructural Evolution and Shear Strength of Nano-Ag Paste Joints with Variable Sintering Temperatures and Particle Sizes
Microstructural Fingerprints for Secure Microelectronic Packaging
Nanoindentation study of Sn and Bi phases in Sn-Bi alloys
Oxygen-free Cu sinter joining in the air on cold-rolled Cu substrates
Plasma-free Surface Modification in Fine-pitch Cu/SiO2 Hybrid Bonding
Reliability and Lifetime Predictions of Fine Pitch Ball Grid Arrays in Thermal Cycling
Reliability of solder joints under extreme conditions of Elevated and Cryo Temperatures for In-Space applications
Silver and Copper Sinter Joint Properties for 1200 V 60A Silicone Carbide MOSFET Power Modules
Sn-Bi Solder Alloys with Sb and Ag Additions: Effect of Microstructure on Mechanical Properties
Study of Electromigration-induced Voids Formation in Solder Microbumps by Using 3D X-Ray Microscopy
Surface precipitation and growth mechanisms of Bismuth particles in Sn-Bi and Sn-Ag-Cu (SAC)-Bi solder alloys
Temperature and strain rate dependence of mechanical properties in Sn-Bi alloys
The Effect of Ag Addition on the Performance of In-rich Binary Solder
The effect of recent heating on the room temperature microstructure of Sn-Bi alloys
The Mechanisms for Enhancing Mechanical Properties through Trace Element Addition in Sn-Bi Solder
Thermal-Structural Coupling Analysis of Cu-Cu Hybrid Bonding in 3D Stacked Die Configurations
Transparent bonding of flexible substrates without an absorber by using laser heating
Unveiling the influence of Interfacial Microstructures on the Evolutions of Interfacial Strength and Electric Resistance of Lamellar Cu/Al/Cu Composites Fabricated by Ultrasonic Welding
Void reduction in Indium TIM in BGA and large size packaging
Wear behavior of cyanide-free silver nanotwin films co-deposited with graphene


Questions about ProgramMaster? Contact programming@programmaster.org