| About this Abstract |
| Meeting |
2020 TMS Annual Meeting & Exhibition
|
| Symposium
|
Ultrafine-grained and Heterostructured Materials (UFGH XI)
|
| Presentation Title |
N-43: Synchrotron-based High-resolution Reciprocal Space Mapping to Understand Elasto-plastic Transition in Harmonic Structured Materials |
| Author(s) |
Elis Sjogren, Wolfgang Pantleon, Ulrich Lienert, Zoltan Hegedüs, Kei Ameyama, Dmytro Orlov |
| On-Site Speaker (Planned) |
Elis Sjogren |
| Abstract Scope |
Harmonic structured (HS) materials have been proposed to enhance structural performance without altering chemical composition. They have a bimodal grain-size microstructure, which consists of a continuous fine-grained network encompassing coarse-grain islands. The elastic-plastic behavior of such materials under mechanical loading needs to be understood. In this work, differences in elasto-plastic behavior between coarse- and fine-grains were investigated in HS pure Ni in comparison to coarse-grained pure Ni using high-energy synchrotron X-rays at Petra III. In situ tensile testing was performed until the early stages of plastic yielding. High-resolution reciprocal space mapping was used as a principal technique for monitoring the concurrent microstructure evolution. It is found that in the HS material, plastic deformation onsets in large grains at stress levels below the proof stress while fine grains deform elastically beyond this stress level. This indicates strain partitioning and confirms earlier reports on the unique elasto-plastic behaviour in HS materials. |
| Proceedings Inclusion? |
Planned: Supplemental Proceedings volume; Planned: Supplemental Proceedings volume |