| About this Abstract |
| Meeting |
2021 TMS Annual Meeting & Exhibition
|
| Symposium
|
Data Science and Analytics for Materials Imaging and Quantification
|
| Presentation Title |
Materials Characterization in 3D Using High Energy X-ray Diffraction Microscopy: Irradiated and Deformed Materials |
| Author(s) |
Hemant Sharma, Peter Kenesei, Jun-Sang Park, Zhengchun Liu, Jon Almer |
| On-Site Speaker (Planned) |
Hemant Sharma |
| Abstract Scope |
This talk will focus on recent developments in the High Energy Diffraction Microscopy (HEDM) technique for studying irradiated and deformed materials. Highlighting the various challenges in both experimentation and data analysis, we will discuss development of novel experimental techniques at the Advanced Photon Source and advanced data analysis techniques leveraging machine learning capabilities. Deep-Learning reinforced data analysis enables real-time reconstructions of highly complex microstructures. Furthermore, we will demonstrate a new data archival format which enables users to directly correlate diffraction information at the sub-grain level with grain-resolved properties. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Characterization, Machine Learning, |