| Abstract Scope |
Advances in instrumentation now enable the scanning diffraction to be taken in aberration-corrected scanning transmission electron microscopes (AC-STEM) at high special resolution. With new approaches in data analysis, this allows the imaging and quantification of various materials properties including symmetry, strain, electric and magnetic field. In this talk, we show our recent study on complex oxides: by coupling a pixelated detector with an AC-STEM, electric field and charge mapping can be obtained at atomic resolution; using atom-by-atom analysis, the electric dipole and its change across interfaces are revealed at the atomic scale; finally, by changing convergence angle, scanning diffraction can probe the sample properties across different scales, and reveal how phenomenon in long ranges emerges from the atomic scale. The application of scanning diffraction on other materials including metallic glass and high entropy oxide will also be discussed. |