Electron back-scattered diffraction (EBSD) mapping has many advantages over traditional imaging methods for polycrystalline systems, most notably grain orientations and morphologies are clearly delineated. With the advent of faster detectors, it is now reasonable to collect maps that contain many thousands of grain cross-sections. However, the large sample tilts needed for high quality EBSD patterns, lead to less than ideal imaging conditions for areas larger than 500 micron^2. In this presentation, we will show how this can be mitigated by using a tiled or mosaic collection strategy, and will demonstrate an algorithm that accounts for and largely removes the spatial distortions present in the EBSD maps, creating nearly seamless stitches between the EBSD tiles. We will then demonstrate how one can create EBSD maps that span multiple millimeters, while maintaining sub-micron accuracy and how this was implemented in the AM Bench data collection process.