|About this Abstract
||MS&T23: Materials Science & Technology
||Processing and Performance of Materials Using Microwaves, Electric and Magnetic Fields, Ultrasound, Lasers, and Mechanical Work – Rustum Roy Symposium
||The Role and Characterization of the Native Oxide Shell of Copper Metal Powder Spherical Particles During High Frequency Microwave Processing
||Morsi Mohamed Mahmoud, Guido Link, Manfred Thumm
|On-Site Speaker (Planned)
||Morsi Mohamed Mahmoud
The native oxide layer on Cu particles was qualitatively characterized using Auger electron spectroscopy (AES) with a rough thickness estimation due to limitations of the AES method and electron beam induced reduction. Moreover, it was quantitatively characterized with more confidence using a dual beam FIB /SEM system after coating Cu particles with Pt prior to any measurements using a special stage tilt setup to avoid any stage tilt correction and to eliminate any possible electron beam reduction. The layer was found to be inhomogeneously covering the particles surfaces where its thickness was strongly depending on particles’ sizes. Its thickness was ranging from around 22-67 nm for 10 Ám average particle size particles and from around 850 nm to 1050 nm for the particles with less than 149 Ám in diameter. In addition, Cu oxide was also observed inside the grains and along grain boundaries with minor amount.