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Meeting MS&T21: Materials Science & Technology
Symposium AI for Big Data Problems in Advanced Imaging, Materials Modeling and Automated Synthesis
Presentation Title Now On-Demand Only: Non-iterative Deep Learning for High-fidelity Microscopic Tomography
Author(s) Singanallur Venkatakrishnan, Amir Koushyar Ziabari, Jacob Hinkle, Micheal Kirka , Jeffrey Warren, Hassina Bilheux, Vincent Paquit, Ryan DeHoff
On-Site Speaker (Planned) Singanallur Venkatakrishnan
Abstract Scope Microscopic computer tomography (CT) is a ubiquitous technique for 3D non-destructive characterization of samples from the nano-meter to micron length scales. However, obtaining high quality 3D reconstructions can be challenging because of the low signal-to-noise ratio, the sparse angular sampling dictated by realistic experiment times, and the complex physics associated with the measurements. In this talk, we will present the development of non-iterative deep-learning-based reconstruction algorithms for microscopic CT data. We will discuss how different network architectures and sources of limited training data (reference samples, single step from a time-resolved scan, and computer-aided design models) can be leveraged to obtain high quality reconstructions from X-ray and neutron CT instruments. These improvements in image quality offered by the deep-learning approach leads to a more efficient use of instrument time enabling faster scans and higher spatio-temporal resolution for time-resolved experiments.


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Machine Learning for Automated Experiment in Scanning Probe and Electron Microscopy
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Now On-Demand Only: Non-iterative Deep Learning for High-fidelity Microscopic Tomography
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