| About this Abstract |
| Meeting |
2021 TMS Annual Meeting & Exhibition
|
| Symposium
|
Advanced Characterization Techniques for Quantifying and Modeling Deformation
|
| Presentation Title |
Characterization and Modeling of Fatigue-induced Grain Growth in Ultrafine Grained Ni |
| Author(s) |
Alejandro Barrios, Ebiakpo Kakandar, Xavier Maeder, Gustavo Castelluccio, Olivier Pierron |
| On-Site Speaker (Planned) |
Alejandro Barrios |
| Abstract Scope |
This work presents the evaluation of fatigue-induced grain coarsening in the ultrafine grained regions of electroplated Ni microbeams tested under bending. Electron backscatter diffraction (EBSD) tomographies reveal that microbeams with a (001) texture microstructure show abnormal grain growth after fatigue tests conducted at maximum strain amplitudes ranging from 0.18 to 0.85% and cycles ranging from 103 to 108. Results highlight cycle dependent growth of grains which exhibit a near (001) orientation along the microbeam’s length direction and average grain growth rates ranging from 10-4 to 1 nm/cycle. Finite Element Simulations of synthetic models of the same microstructure reveal that the main driving force for grain growth is the reduction in elastic strain energy, although the strain energy density of the coarser grains is not at the minimum. Additionally, the apparent Schmid factor of the coarser grains tends to be larger suggesting that plastic deformation enables grain growth. |
| Proceedings Inclusion? |
Planned: |