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Meeting 2024 TMS Annual Meeting & Exhibition
Symposium Recent Advances in Electron Back-Scattered Diffraction and Related Techniques
Organizer(s) Stuart I. Wright, EDAX
Marc J. De Graef, Carnegie Mellon University
David J. Rowenhorst, Naval Research Laboratory
Katharina Tinka Marquardt, Imperial College
Scope This symposium focuses on the use of Electron Backscattered Diffraction (EBSD) in the Scanning Electron Microscope (SEM) but contributions on related SEM based techniques are encouraged as well including: Transmission Kikuchi Diffraction (TKD), Electron Channeling Patterns (ECP) and Electron Channeling Contrast Imaging (ECCI). We invite contributions in the following areas:

• Advances in theory, modeling, indexing and interpretation of diffraction patterns.
• Novel analysis and quantitative metrics of EBSD data
• Advances in detector systems, including direct electron detection
• EBSD, TKD, and/or ECP/ECCI applications in Materials Science
• EBSD, TKD, and/or ECP/ECCI applications in Geology
• Open source software related to EBSD, TKD, ECP, ECCI

Abstracts Due 07/01/2023
Proceedings Plan Undecided
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