| About this Abstract |
| Meeting |
MS&T21: Materials Science & Technology
|
| Symposium
|
Phase Transformations in Ceramics: Science and Applications
|
| Presentation Title |
In-situ TEM Observation on the Motion of Phase Boundaries during Antiferroelectric ↔ Ferroelectric Transition |
| Author(s) |
Binzhi Liu, Xinchun Tian, Lin Zhou, Xiaoli Tan |
| On-Site Speaker (Planned) |
Binzhi Liu |
| Abstract Scope |
In-situ biasing transmission electron microscopy (TEM) was applied on a FIB-machined antiferroelectric Pb0.99{Nb0.02[(Zr0.57Sn0.43)0.94Ti0.06]0.98}O3 thin foil. The unique TEM holder equipped with an electrode probe is capable of recording current when the bias is employed. The probe was manipulated to contact the edge of the TEM specimen, and the displacive phase transition is explored. An area of radius of ~100 nm composed of multiple nuclei is observed, which is the critical size of nucleation, accompanied by a current spike due to the antiferroelectric phase transiting to the ferroelectric phase. It is noticed that the motion of the interphase boundary displays a strong crystallography dependence. In a [001]c oriented grain, two nonadjacent segments alone (010)c planes of a pre-existed ferroelectric domain moved together and merged, with the rapid consumption of (100)c plane segment. For another [-111]c oriented grain, the interface boundary moved apparently along <-1-10>c with different velocities. |