| About this Abstract |
| Meeting |
Materials Science & Technology 2020
|
| Symposium
|
Advances in Dielectric Materials and Electronic Devices
|
| Presentation Title |
Structural Peculiarities of Epitaxial PMN-PT Thin Films |
| Author(s) |
Matjaž Spreitzer, Urška Gabor, Jamal Belhadi, Nina Daneu, Danilo Suvorov |
| On-Site Speaker (Planned) |
Matjaž Spreitzer |
| Abstract Scope |
Pb(Mg1/3Nb2/3)O3–PbTiO3 is a relaxor ferroelectric material that exhibits interesting dielectric and piezoelectric properties. Specifically, complex domain architectures are formed in compositions around the morphotropic phase boundary. The polar structure of thin films is additionally affected by the epitaxial strain. In order to understand the structure of these films, multi-scale analysis is needed, considering the limitations of the individual analytical technique. Furthermore, it will be shown how macroscopic piezoelectric and dielectric measurements in different configurations can aid in understanding the film's structural characteristics. Growth-related aspects will also be discussed, with emphasis on the challenges and peculiarities occurring in the growth of films with volatile components. Routes for the preparation of single-phase films with near-nominal stoichiometry will be presented, along with the specific defects that appear with off-stoichiometry. It will be shown why in some cases a rough interface is preferred for phase purity and film quality. |