|About this Abstract
||MS&T21: Materials Science & Technology
||Probing Defect Properties and Behavior under Mechanical Deformation and Extreme Conditions
||The Effects of Sample-preparation-induced Defects on the Mechanical Properties of Single Crystal Aluminum Nano-pillars
||Yang Yang, Sarah Wang, Bin Xiang, Sheng Yin, Thomas Pekin, Xiaoqing Li, Ruopeng Zhang, Kayla Yano, David Hwang, Mark Asta, Costas Grigoropoulos, Frances Allen, Andrew Minor
|On-Site Speaker (Planned)
In situ TEM nano-pillar compression experiments have been extensively applied to decipher the mechanical behavior of materials at the nano-scale. However, the sample preparation process often inevitably introduces defects that may significantly impact the mechanical performance of samples with electron transparent dimensions. An understanding of the advantages and disadvantages of different sample fabrication methods is necessary to choose the most suitable method for a reliable experiment. Here, we systematically studied the effects of various focused-ion-beam (FIB) pillar fabrication parameters in a single crystal aluminum (Al) system with well-controlled crystal orientation. Also, we proposed a novel method to fabricate square-shaped pillars to minimize FIB artifacts such as tapering, high pillar base compliance, and preferential deformation at the pillar tip.