|About this Abstract
||2020 TMS Annual Meeting & Exhibition
||Atom Probe Tomography for Advanced Characterization of Metals, Minerals and Materials III
||Post-morten Selected Area Analysis for Optimized Statistical Analysis of APT Data
||Frederic Danoix, Alexander Dahlstrom, Begonia Gomez Ferrer, Cristelle Pareige
|On-Site Speaker (Planned)
Latest generation of instruments allows atom probe analysis with wide angular apertures that most of the low index directions are included in the analysed volumes. For a decade now, many efforts have been devoted to retreive, at least partly, the cristallographic informations contained in the analysed volumes, either for assessing the analysed cristal(s) orientation(s), or to correlate it with nanostructural features present in the reconstructed volume. However, little attention has been drawn to investigate, in a given sample, the possible local artefacts araising from the presence of low index poles, and ultimately find the optimal regions for optimized data processing. Here, we present such investigations showing the potential for ‘post-morten selected area analysis’ of APT datasets in the cases of phase separation in FeCr alloys, and tracking long range order in metallic alloys.
||Planned: Supplemental Proceedings volume