About this Abstract |
Meeting |
2023 TMS Annual Meeting & Exhibition
|
Symposium
|
Neutron and X-ray Scattering in Materials Science
|
Presentation Title |
Polychromatic Multiplexing Stress-strain Diffractometer |
Author(s) |
Sean Fayfar, Boris Khaykovich, Theodore Cremer |
On-Site Speaker (Planned) |
Sean Fayfar |
Abstract Scope |
The development of new materials for advanced technologies such as electric cars and clean energy production requires new characterization techniques, especially with in-situ measurements during synthesis. Neutron scattering techniques have gained in popularity with the development and improvements of beamline instruments at national facilities. Current engineering beamlines with stress-strain diffractometers require long measurement times due to small gauge volumes in samples. We present our development of a stress-strain diffractometer intended to be optimized for improved efficiency compared with current designs. The diffractometer will utilize a polychromatic beam to illuminate all the lattice planes within the sample at a fixed angle and focusing bent-perfect silicon analyzers placed after the sample. Silicon analyzers are transparent to neutrons which allows the placement of subsequent analyzers for multiplexing capabilities. We will present our results from both experimental testing and ray-tracing simulation and report on the current state of the construction at the MIT Reactor. |
Proceedings Inclusion? |
Planned: |
Keywords |
Characterization, Iron and Steel, Other |