A high degree of spatial coherence is an attractive property in X-ray and electron beams. In some cases, these imaging methods provide resolution beyond that achieved with optics and can also provide remarkable sensitivity to a variety of contrast mechanisms. Various novel X-ray and electron coherent imaging methods have been developed and optimized, leading to rapid growth in applications over the past decades. It is expected that this progress will get a further boost as new sources which deliver highly coherent beams would allow experiments at better precision and sensitivity in shorter time.
This symposium will highlight cutting-edge research in coherent and phase contrast imaging techniques, including X-ray and electron-based approaches like coherent diffraction imaging (CDI), ptychography, holography, and advanced phase contrast imaging (PCI) methods. We will explore their applications across diverse materials classes and delve into the integration of modeling, simulation, and artificial intelligence (AI) for enhanced characterization and analysis. We hope this symposium will help to foster collaboration and advance the field of coherent and phase contrast imaging.
Areas of interest include, but are not limited to:
· All coherent and phase contrast X-ray-based techniques including Bragg CDI, Fresnel CDI, ptychographic CDI, propagation phase contrast imaging, interferometry imaging, and analyzer-based phase-contrast imaging.
· All electron-based techniques including ptychography and electron CDI.
· High performance computing (HPC) and AI to accelerate data analysis, improve image quality, imaging speed/efficiency, and autonomously steer experiments.
· Digital twins to inform high-resolution imaging experiments.
· AI/ML techniques for high resolution x-ray/electron image analysis.
· All structural and functional materials systems needing high resolution imaging.
· Developments of new CDI/PCI experimental methods.
· New sample preparation and in-situ/operando measurement protocols.