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About this Symposium

Meeting 2027 TMS Annual Meeting & Exhibition
Symposium Four-Dimensional Scanning Transmission Electron Microscopy (4D STEM) for Quantitative Materials Characterization
Sponsorship TMS Extraction and Processing Division
TMS Structural Materials Division
TMS: Advanced Characterization, Testing, and Simulation Committee
TMS: Materials Characterization Committee
Organizer(s) Yang Yang, Pennsylvania State University
Benjamin Savitzky, Brown University
Meng Li, Brookhaven National Laboratory
Christoph Gammer, Austrian Academy Of Sciences
Paul Voyles, University of Wisconsin
Scope Four-dimensional scanning transmission electron microscopy (4D STEM) has rapidly emerged as a transformative platform for quantitative materials characterization. By recording a full diffraction pattern at each probe position, 4D STEM enables spatially resolved mapping of crystal orientation and phase, elastic strain and rotation, local symmetry breaking and ordering, and mesoscale heterogeneity over large fields of view. When paired with reconstruction methods such as ptychography, 4D STEM can surpass conventional resolution limits and deliver high-fidelity phase imaging. Modern workflows also support quantitative mapping of electric and magnetic fields and statistically robust detection of point and planar defects. These strengths make 4D STEM attractive for complex materials where traditional atomic-resolution approaches struggle, and for integration with in situ and operando experiments.

 
This symposium is timely because 4D STEM is increasingly accessible in commercial instruments while advances in detectors, acquisition strategies, analysis software, and artificial intelligence continue at a rapid pace. The symposium will bring together experts from microscopy and materials communities to share new 4D STEM methodologies and highlight impactful applications across structural and functional materials, including metals, ceramics, semiconductors, energy materials, soft and hybrid materials, and minerals.

We welcome contributions that present: 
(i) New techniques or analysis pipelines, including tutorial-style “how-to” talks;
(ii) Validation and metrology studies addressing accuracy, precision, uncertainty quantification, and standards;
(iii) Applications that reveal structure–property relationships or access previously hidden materials information.
 
Topics of interest include acquisition and detector innovations; orientation, phase, strain, electric and magnetic field mapping; local ordering and symmetry analysis; ptychography and phase reconstruction; defect and interface characterization; in situ and operando 4D STEM (heating, biasing, mechanical testing, electrochemistry, environmental cells, radiation, time-resolved studies); and data analytics, automation, and best practices for sharing and reproducibility.

Abstracts Due 07/15/2026
Proceedings Plan Planned:

PRESENTATIONS APPROVED FOR THIS SYMPOSIUM INCLUDE


4D-STEM diffraction tomography of lattice mismatched nanoparticles
AI-assisted 4D-STEM for quantitative materials characterization
Atomic Level Interfacial 4D-STEM Characterization of Annealed Ferroelectric HZO Thin Films
Beyond Bragg Peaks: Quantitative Defect Mapping Through Diffuse Scattering in 4D-STEM
Computational Electron Microscopy at Scale: From 4D-STEM Data to Quantitative, Multimodal 3D Structures
Defect Formation in Laves Phases During Additive Manufacturing: A Mechanism for Thermal Strain Accommodation
Dynamic Scan Patterns and Automated Data Processing for In Situ 4D-STEM
Efficient Three-Dimensional Imaging with Phase-Contrast 4D-STEM
Extracting Hidden Signals in 4D STEM: Spatial and Temporal Fluctuations in Complex Materials
From Ptychography to SEM-Based Diffractive Imaging: Extending 4D-STEM to New Regimes
High-Dimensional Electron Diffraction for Local Structure and Bonding Determination
Imaging vacancy evolution during metal dealloying by in-situ 4D-STEM
In situ 5D STEM of Metallic Liquids and Their Crystallization
Integrated 4D-STEM Workflows for Quantitative, Reproducible Materials Characterization
Interfacial structure–property relationships in Cu/Nb and Ti/Nb nanolaminates via high-throughput neural object detection 4D-STEM
Interpreting Short Range Order and Defects with 4D-STEM
Investigating Vacancy Effects in Cr–Ni Diffusion Couples by 4D-STEM
Latent‑Space Diffraction Mapping of Recrystallization Pathways in GaAs
Multi-scale Characterization of Complex Alloys: 4D-STEM Across Convergence Angles
Novel Simultaneous Imaging of Anti-phase Domains and Magnetic Microstructure using Lorentz 4D-STEM
Operando Electrochemical 4D-STEM at Dynamic Energy Materials Interfaces
Probing real-space topological textures in multiferroic heterostructures using multi-modal electron microscopy
Probing Structure Evolution in Metallic Glasses during Mechanical deformation with 5D STEM
Quantifying chemo-mechanics during metal oxidation by precession-assisted 4D-STEM
Quantitative 4D-STEM Strain Mapping of Multilayer Ferroelectric Thin Films
Quantitative electron pair distribution function and electromagnetic field mapping in materials
Quantitative Structure-Property Relationships in Metallic Glasses Revealed by 4D STEM
Recent Advances in 4D-STEM Characterization of Functional Complex Oxides
Revealing multiple pathways of ringwoodite and wadsleyite formation in the Catherwood L6 shocked meteorite using SEM and STEM diffraction
STEMx Precession: a new tool for precession-assisted 4D STEM acquisition in DigitalMicrograph
Tracing physical aging via simulated 4DSTEM in metallic glasses
Using 4D-STEM to Map and Explain Heterogeneous Oxide Growth of Zr Alloys for Nuclear Fission Applications
Visualizing Charge Order and Magnetism with Cryogenic 4D-STEM


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