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Meeting MS&T24: Materials Science & Technology
Symposium Additive Manufacturing: Equipment, Instrumentation and In-Situ Process Monitoring
Sponsorship TMS: Additive Manufacturing Committee
Organizer(s) Joy Gockel, Colorado School Of Mines
Sneha Prabha Narra, Carnegie Mellon University
Samantha Webster, Nist - Gaithersburg
Ola L. Harrysson, North Carolina State University
Ulf R. Ackelid, Freemelt AB
Scope The purpose of this symposium is to review and discuss various aspects of equipment, instrumentation, and measurement technology used for Additive Manufacturing (AM), from R&D to production applications. We welcome research exploring both existing solutions on commercial AM systems, as well as new innovative technologies which are still at a laboratory stage.

Suitable topics for this symposium include, but are not limited to, the following:

1. New methods, technologies, concepts and equipment for AM, such as:

a. feedstock distribution
b. methods for consolidation
c. beam scanning algorithms
d. improvements of lasers, electron guns, print heads, etc.
e. build chamber environment
f. methods for improved process stability and repeatability

2. Innovative development of auxiliary instrumentation and methods intended for AM In-situ process monitoring and control methods, such as:

a. Monitoring of feedstock deposition quality
b. In-process defect repair
c. Thermal monitoring and mapping
d. Real-time melt pool characterization
e. Evaporation loss measurement
f. Monitoring of vacuum quality, process gas purity, and gas flow pattern
g. High-speed imaging of fast processes such as powder distribution, melt pool dynamics, spattering, and electrostatic levitation
h. Machine health monitoring
i. Detection of acoustic signals, optical emission, X-rays, backscatter electrons.

3. Relationships of machine technology and instrumentation equipment from (1.) and (2.) to processing outcomes, such as:

a. Detection of porosity and other defects
b. Prediction of microstructural features and properties
c. Monitoring of dimensional accuracy (XY) and surface topography (Z)
d. Data analysis including AI and ML techniques

Abstracts covering additive manufacturing research and standards development will also be welcomed.

Abstracts Due 05/01/2024
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