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About this Symposium

Meeting 2027 TMS Annual Meeting & Exhibition
Symposium Electronic Packaging and Interconnection Materials IV
Sponsorship TMS Functional Materials Division
TMS: Electronic Packaging and Interconnection Materials Committee
Organizer(s) Yu-An Shen, Feng Chia University
Christopher M. Gourlay, Imperial College London
Albert T. Wu, National Central University
Fan-Yi Ouyang, National Tsing Hua University
Chien-Lung Liang, National Taiwan University of Science and Technology
David P. Yan, San Jose State University
Fu Guo, Beijing University Of Technology
Hannah Fowler, Sandia National Laboratories
Mohd Sharizal Abdul Aziz, Universiti Sains Malaysia
Mohd Arif Anuar Mohd Salleh, Universiti Malaysia Perlis
Scope Continuing advances in microelectronic, opto-electronic and nano-electronic devices require new materials and technologies to meet the increasing electrical, thermal, mechanical, reliability, performance and environmental demands placed on interconnects and packaging at all levels. This symposium will address current research in packaging materials and processes, including Pb free solders, Ag and Cu sintering, hybrid bonding, conductive adhesives, epoxy, substrates, 3D packaging, wafer level packaging, quality, reliability, and failure analysis.

Topics of interest include, but are not limited to:

* Packaging materials and processes for next generation packages, e.g., 3D packaging, wafer level packaging, photonic packaging, Internet of Things (IoT), flexible electronics, wire bonding, automotive and power electronics.
* Interconnects for packages, e.g., Pb-free solder, micro bumps, Through-silicon-vias (TSVs), direct Cu to Cu bonding, wire bonding, conductive adhesive, optoelectronic interconnects, transient liquid phase bonding, sintered nano-powder joints, polymer core solder balls and alternative interconnect materials at chip and package levels.
*Additive manufacturing and 3D printing for electronics industry
* Other packaging materials e.g., epoxy, molding compounds, epoxy flux, thermal interface material (TIM), substrate materials and process.
* Quality, Reliability, and failure analysis for next generation packages.
* Continuing challenges in implementing Pb-free solders for interconnections, plating and thermal interface material (TIM) applications
* Developments in high temperature Pb-free solders and associated interconnects for automotive and power electronics
* Developments in low temperature Pb-free solder alloys and fine pitch solder joints
* Electromigration, thermomigration, stress-migration and mechanical effects
* Whisker growth in Sn, Sn-based alloys and other metallic systems
* Advanced characterization methods as applied to interconnect technology
* Fundamental material behavior including phase transformations, computational thermodynamics, solidification, microstructure evolution, micromechanics, corrosion, mechanical, thermal, and electrical properties of solders and intermetallic compounds

Abstracts Due 07/15/2026
Proceedings Plan Planned: TMS Journal: Journal of Electronic Materials

PRESENTATIONS APPROVED FOR THIS SYMPOSIUM INCLUDE


3D X-ray Imaging and Defect Detection for Various Interconnects in Advanced Packaging
3D X-ray Imaging and Physics-based Simulation of 3D Defect Evolution in BGA Solder Joints under Thermal Cycling
A Three-Step Simultaneous Cutting & Chamfering (Dicing) Ultrafast-Laser Process for Reliable Singulation of Thin Amorphous Glass Disks: The Role of Wafer-Grade Vacuum Chucking and Direct-Drive Rotary Motion
Achieving Fluxless Bonding of Pure Indium TIM via Silver Metallization for Heat Dissipation in HPC Packaging
Crystallinity-Gradient Co–P Metallization for Rapid Co–Sn Full-IMC Interconnects
Development of Sn–In–Ag Composite Solder using Transient Liquid Phase Bonding
Effect of Ag Addition on the Microstructural Evolution and Bonding Behavior of Cu–Ag Alloy Thin Films
Effect of Cu Processing Conditions on the high-temperature stability and Thermal Properties of Cu Sintered Spacers
Effect of Grain Structure on Low-Temperature Ag-Cu Heterogeneous Direct Bonding Without CMP
Effects of Bi and In Additions on Cu Interfacial Reactions in Medium-Temperature Lead-Free Solders
Electric-field assisted formation of stable one-dimentional SAC305 solder microparticle interconnects
Electromigration Behavior and Dynamic Mechanical Response of Indium-Modified Sn/Ag/Cu Solder Joints.
Electromigration behavior of Cu₃Sn interconnects fabricated via Solid-Liquid Interdiffusion
Evolution of Microstructure and Micro-hardness in Room-Temperature Aged Sn-5wt%Bi Alloys: A Quasi In-Situ Study on Precipitation Kinetics
Interfacial Stability and Reliability of Sn–3.5Ag Solder Joints with FeCoNiMn Diffusion Barriers
Liquid/Solid interfacial reactions between the Sn solder and Cu-Be alloy (Alloy 25) with the Ni electroplating layer
Long-Term Thermal Reliability and Microstructural Evolution of Near-Eutectic Sn-Bi-Ag-Sb/Cu Solder Joints
Low-Temperature Rapid Formation and Diffusion Mechanism of Co-Sn Full-IMC Interconnects for Power Electronic Packaging
Microstructure-Controlled Bonding and Thermal Stability in Planarized Ag–Cu Direct Bonding
Microstructure-Controlled Sn-In/Sn-Bi-Ag Composite Solders for Low-Temperature High-Toughness Packaging
Microstructure evolution and crack propagation in Sn-Ag-Cu-Bi solder joints during harsh thermal cycling
Multi-Layer Energy Transfer and Interfacial Heterogeneity in Ultrasonically Welded Ni/Al Lamellar Structures for EV Battery Tab Applications
Non-destructive Characterization of High Bandwidth Memory
Position-Dependent Cracking Behavior of Micro-Solder Joints on AlN Ceramic Substrates under Thermal Cycling
Solder in Vibration: Predicting Solder Joint Reliability during High Cycle Fatigue
Solderability and Interconnect Performance in Additively Manufactured Flex Cables
Stress and Temperature Driven Crossover in Deformation Mechanisms in Cu-based Thin Films
Suppressing Sn Whisker Growth by Interlayer Engineering: Effect of Residual Stress, Alloying and Interface Chemistry
Thermal Transport and Reliability of Indium–Diamond Composite Paste for Advanced Packaging Applications
Thermomechanical Design-Space Quantification of Direct Cu–Cu Bonded Interconnect Geometry and Population in 3D Stacked Dies
X-ray Laminography for Defect Characterization in 3D Heterogeneous Integrated Packages


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