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About this Symposium

Meeting 2026 TMS Annual Meeting & Exhibition
Symposium Electronic Packaging and Interconnection Materials III
Sponsorship TMS Functional Materials Division
TMS: Electronic Packaging and Interconnection Materials Committee
Organizer(s) Praveen Kumar, Indian Institute of Science
Yu-An Shen, Feng Chia University
C. Robert Kao, National Taiwan University
Kazuhiro Nogita, University of Queensland
Albert T. Wu, National Central University
Mohd Arif Anuar Salleh, Universiti Malaysia Perlis
Hannah Fowler, Sandia National Laboratories
Chien-Lung Liang, National Taiwan University of Science and Technology
Yan Li, Samsung Semiconductor Inc.
David Yan, San Jose State University
Mohd Sharizal Abdul Aziz, Universiti Sains Malaysia
Scope Continuing advances in microelectronic, opto-electronic and nano-electronic devices require new materials and technologies to meet the increasing electrical, thermal, mechanical, reliability, performance and environmental demands placed on interconnects and packaging at all levels. This symposium will address current research in packaging materials and processes, including Pb free solders, Ag and Cu sintering, hybrid bonding, conductive adhesives, epoxy, substrates, 3D packaging, wafer level packaging, quality, reliability, and failure analysis. Topics of interest include, but are not limited to:

• Packaging materials and processes for next generation packages, e.g., 3D packaging, wafer level packaging, photonic packaging, Internet of Things (IoT), flexible electronics, wire bonding, automotive and power electronics
• Interconnects for packages, e.g., Pb-free solder, micro bumps, Through-silicon-vias (TSVs), direct Cu to Cu bonding, wire bonding, conductive adhesive, optoelectronic interconnects, transient liquid phase bonding, sintered nano-powder joints, polymer core solder balls and alternative interconnect materials at chip and package levels. *Additive manufacturing and 3D printing for electronics industry
• Other packaging materials e.g., epoxy, molding compounds, epoxy flux, thermal interface material (TIM), substrate materials and process
• Quality, Reliability, and failure analysis for next generation packages
• Continuing challenges in implementing Pb-free solders for interconnections, plating and thermal interface material (TIM) applications
• Developments in high temperature Pb-free solders and associated interconnects for automotive and power electronics
• Developments in low temperature Pb-free solder alloys and fine pitch solder joints • Electromigration, thermomigration, stress-migration and mechanical effects
• Whisker growth in Sn, Sn-based alloys and other metallic systems
• Advanced characterization methods as applied to interconnect technology
• Fundamental material behavior including phase transformations, computational thermodynamics, solidification, microstructure evolution, micromechanics, corrosion, mechanical, thermal, and electrical properties of solders and intermetallic compounds

Abstracts Due 07/29/2025
Proceedings Plan Planned:

PRESENTATIONS APPROVED FOR THIS SYMPOSIUM INCLUDE


A Comprehensive Study on the Thermal Behaviors of Diamond/Silver Metal Matrix Composites for Enhanced Thermal Management of Electronics
Adhesion Behavior of Ta and TaN Barrier Layers for Cu Metallization in Advanced Packaging
Alkali and Alkaline Earth Modified Borosilicate Glass with Quartz Particles Filler for 5G/6G Packaging
Amorphous Co-P Coating Enabled In-Situ Formation of CoSn₃ Skeletons for Enhanced Thermal Fatigue Resistance of Solder Joints
Au–Au Bonded Microfluidic Cooling for High-Power Chiplet Packages
Cellulose Nanofiber Enhanced SAC Solder with Improved Reliability through Microstructure Control
Characterization of Electronic Device Dielectric Packaging Breakdown Phenomena
Comparison of (enhanced) sintered silver interconnects to traditional solders for high-power semiconductor devices: a TMCL study
Corrosion Effect Analysis of Heat Dissipation Components in AI Server Liquid Cooling Systems
Cu-core solder interconnect Joule heat induced temperature rise under high density current stressing
Damage accumulation and failure in Sn-3Ag-0.5Cu/Cu and Sn-0.5Cu-0.04Ni/Cu solder joints
Defect detection and analysis of Through Silicon Vias (TSVs) in Electronic Packages by X-ray Laminography and 3D X-ray Tomography
Development and characterisation of In-Sn-Bi alloys designed for harsh operating environments: Overview
Development of a Low-Temperature Processable In-Based Thermal Interface Material with High Thermal Conductivity and Mechanical Compliance
Directional Electromigration-Induced Void Nucleation in Copper Bicrystals for TSV Reliability: A Molecular-Dynamics Study
Effect of Grain Size and Microstructural Heterogeneity on the Bonding Behavior of Electroplated Copper Films
Effect of Ni Addition on Resistivity and Electromigration Resistance in Co Thin Films
Effects of Zn concentration on the interfacial evolution in 50Sn-Bi-xZn/Cu solder joints during aging conditions
Electromigration Behavior of Cu-Doped Nanotwinned Ag Joints for Low-Vacuum Direct Bonding Applications
Electromigration Behavior of TLP Bonded Ni/Sn-1.0Ag-0.5Cu/Ni Solder Interconnects: An EBSD Study
Electronic Thin Film Package
Enhanced Ag Nanopaste Bonding with Cu Surface Pre-Treatment of Self-Assembled Monolayers
Enhancing Power Generation Stability of Thermoelectric Pillars by Suppressing Diffusion and IMC Formation at the Bi-Te/Sn Interface Using Co-P Coatings
Experimental investigation of thermal conductivity during aging of nanoporous sintered silver
Fabricate Scaffold Cu6Sn5 Structure In Sn Joint By Cu(Sn-Cu) Nanoparticles-Contained Sn Powder
FE-based evaluation of moisture-induced delamination risks in semiconductor package
Grain Boundary Migration–Driven Cu–Cu Bonding at Low Temperature and Pressure Using Atomic-Scale Surface Films
High temperature Lead-free solder alloy: Microalloying in microstructure evolution and mechanical behavior
High Thermal Conductivity Jelly-Like Liquid Metal TIMs
Hybrid-Grain Electroplated Cu Films for Enhanced Cu–Cu Bonding
Indium Alloying in Sn-58Bi Low-Temperature Solder and its Effect to the Microstructure, Thermal and Mechanical Properties.
Informing Lifetime Predictions of Solder Joints with High Cycle Fatigue Testing
Interfacial Reaction in Cu-37Zn/Sn/Cu-37Zn Solder Interconnects Induced by Electromigration: An EBSD Study
Interfacial Reactions in the Cu/Sn/In/Ni/Cu Multilayers Structure for 3D IC Packaging
Investigation of Interfacial Reactions of the Sn-9Zn solder with Ni-xPd substrates at 240, 270, 300, and 330oC
Investigation of Silicon Wafer-Level Warpage under Varying Reflow Thermal Profiles, Wafer Sizes, and Thicknesses
Kinetic Analysis of Segregation and Homogenization Behavior in Indalloy 227 (Sn-20In-2.8Ag) Solder
Low-Temperature, Low-Pressure Cu–Cu Direct Bonding Enabled by Electroplated Ultra-Fine-Grained Copper
Mechanism of Cu Addition in Suppressing Continuous Void Formation at the Sn-In-Zn-Bi/Cu Interface during Thermal Aging
Microstructural Analysis of Ultrasonically Welded 316L/Copper Joints for Electrical Terminals
Microstructural Evolution and Interfacial Reaction between Indium Solders and Ag under a Temperature Gradient during Reflow Process
Microstructural Evolution in Sn-Bi Pb-free Solders
Microstructural Fingerprints for Secure Microelectronic Packaging
Microstructure and Interfacial Evolution of Ag-modified In-Sn Alloys
Microstructure Evolution and mechanical Response of Bi/Ni-Modified SAC105 Solder
Minor Ag and Zn Additions Altering the Microstructure, Properties, and Solderability of Sn–40Bi Alloy
Novel Liquid Metal Thermal Interface Material with High Thermal Conductivity and Viscosity
Plasma-Enhanced Polyimide Bonding via Surface Modification
Precipitation mechanisms in Sn-Bi low temperature solder
Quasi in-situ observation of microstructural evolution for Sn-3Ag-0.5Cu solder joints under a wide Temperature range thermal cycling
Rapid and Low-Temperature Formation of Full CoSn₃ IMC Joints for Power Chip Packaging by TLP Process
Reliability Enhancement of Bi and In Additions for Advanced Packaging
Role of Ag additions on Microstructure, Phase Transformation and Thermal Reactions of In-35Sn Alloys
Role Of Indium And Antimony In Enhancing The Microstructure And Mechanical Performance Of SAC305 Solder Alloy
Self-Assembling Sn-Epoxy for Low-Temperature Soldering and One-Step Flip-Chip Bonding with Underfill
Silver-Copper Mixed Sinter Joint Property of Silicone Carbide Device Power Modules
Strain-rate sensitivity on solders via nanoindentation
The Effect of Electromigration on Solder Joint Morphology and Properties
The Evolution of the Abnormal Grain Growth and Stress Behavior in Electroplated Cu With and Without Ni/Au Metallization Under Thermal Annealing
The impact of surface diffusion on microstructural evolution in Cu/Sn solder joint
The microstructure evolution within the SAC305/Sn58Bi hybrid solder bump under isothermal aging
Thermal Analysis and Mechanical Property Evaluation of Sn-1Ag-0.7Cu-5BixIn/Cu Solder Joints
Thermal Expansion of Near-Eutectic Sn-Bi Solder: Effects of Temperature Ramp Rate and Bi Dissolution
Thermomechanical Correlation of Interfacial Shear and Warpage in Cu–Cu Bonded 3D Stacked Die Packages Thermal Cycling
Zn-Induced Modifications in Intermetallic Formation at the Sn-Bi/Cu Interface
Zone-Based Thermo-Mechanical Gradient Mapping in Cu–Cu Bonded 3D Stacked Die Packages for Reliability Analysis


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