About this Symposium |
| Meeting |
2026 TMS Annual Meeting & Exhibition
|
| Symposium
|
Recent Advances in Electron Back-Scattered Diffraction and Related Techniques
|
| Sponsorship |
TMS Structural Materials Division
TMS: Advanced Characterization, Testing, and Simulation Committee
|
| Organizer(s) |
Stuart I. Wright, EDAX
Andrew Polonsky, Sandia National Laboratories
Alice Bastos da Silva Fanta, DTU Technical University of Denmark |
| Scope |
This symposium focuses on the use of Electron Backscattered Diffraction (EBSD) in the Scanning Electron Microscope (SEM) but contributions on related SEM based diffraction techniques are also encouraged including Transmission Kikuchi Diffraction (TKD), Electron Channeling Patterns (ECP), Electron Channeling Contrast Imaging (ECCI) and 4DSTEM in the SEM.
We invite contributions in the following areas:
• Advances in theory, modeling, indexing and interpretation of diffraction patterns.
• Novel analysis and quantitative metrics of SEM based diffraction data
• Advances in detector systems, including direct electron detection
• Developments in data collection strategies to enhance the efficiency and accuracy of SEM-based techniques
• SEM based diffraction applications in Materials Science
• SEM based diffraction applications in the Earth Sciences |
| Abstracts Due |
07/29/2025 |
| Proceedings Plan |
Planned: |