About this Abstract |
| Meeting |
2026 TMS Annual Meeting & Exhibition
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| Symposium
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Microstructure-Sensitive Modeling Across Length Scales: An MPMD/SMD Symposium in Honor of David L. McDowell
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| Presentation Title |
Insights Into the Evolution of Slip in Cyclically Loaded IN718 Using Crystal Plasticity Finite Element, High Energy X-Ray Diffraction Microscopy and TriBeam Tomography |
| Author(s) |
Justine Schulte, Dalton Shadle, Kelly Nygren, Matthew Miller, Tresa Pollock, Irene Beyerlein |
| On-Site Speaker (Planned) |
Justine Schulte |
| Abstract Scope |
To design alloys with improved fatigue resistance for aerospace applications, it is necessary to understand early-cycle slip events on a sub-grain level. Of particular importance is irreversible slip as it has been linked to fatigue crack initiation in polycrystals. In this work, microstructure-sensitive crystal plasticity finite element (CPFE) modeling is coupled with high energy X-ray diffraction microscopy (HEDM) and SEM-based Tribeam tomography to study slip and intragranular orientation evolution during cyclic loading of polycrystalline Inconel 718. Post-test Tribeam tomography provides a 3D microstructure reconstruction that can be explicitly meshed to create a high-fidelity polycrystalline model. HEDM provides grain-scale time-resolved strain and orientation information as the sample is cyclically loaded. The simulation can predict patterns in slip during cyclic loading and identify intragranular regions of slip accumulation. The proximity of these regions to different microstructural features is examined to lend insights into the influence of the grain neighborhood on cyclic properties. |
| Proceedings Inclusion? |
Planned: |