About this Abstract |
| Meeting |
2026 TMS Annual Meeting & Exhibition
|
| Symposium
|
Characterization of Minerals, Metals and Materials 2026 - In-Situ Characterization Techniques
|
| Presentation Title |
Pink-Beam Dark-Field X-ray Microscopy: a new tool for fast and in-situ characterization of microstructural features |
| Author(s) |
Michela La Bella, Henning Friis Poulsen, Steffen Staeck, Carsten Detlefs, Can Yildirim |
| On-Site Speaker (Planned) |
Michela La Bella |
| Abstract Scope |
Dark-Field X-ray Microscopy (DFXM) is a powerful full-field imaging technique that permits mapping strain, orientation, and structural defects in bulk crystalline materials. In its classical implementation, it relies on monochromatic radiation, resulting in low fluxes and extended acquisition times.
Here we present Pink-Beam Dark-Field X-ray Microscopy (pDFXM), a novel tool developed at the ID03 beamline of the ESRF. The use of a broadened energy bandwidth allows time-resolved studies and enables in-situ characterizations of weakly diffracting crystalline materials. The advantages and disadvantages of pDFXM are discussed. We provide a systematic quantitative evaluation of the direct and reciprocal space resolution functions based on comparisons between geometrical optics simulations and experimental data. We also present examples of dislocation imaging with both monochromatic and pink radiation, offering future users a full description of the potential and pitfalls of pDFXM. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Other, Other, Other |