About this Abstract |
| Meeting |
2026 TMS Annual Meeting & Exhibition
|
| Symposium
|
Advances in Magnetism and Magnetic Materials
|
| Presentation Title |
Recent Advances in Magnetic Materials Characterization by Means of Lorentz Transmission Electron Microscopy |
| Author(s) |
Marc J. De Graef |
| On-Site Speaker (Planned) |
Marc J. De Graef |
| Abstract Scope |
Lorentz transmission electron microscopy (LTEM) has been used since the 1960s to study magnetic domain walls and magnetic microstructures in a variety of bulk and thin film materials. The technique relies on the deflection of the electron beam by the in-plane component of the magnetic induction in and around the sample, and generally has a deflection angle of the order of a few tens of microradians. In this presentation, we will provide both a historical review of the most important improvements in LTEM in the last 4-5 decades, as well as an overview of different traditional observation modalities (Foucault and Fresnel imaging, differential phase contrast, etc.) and more modern approaches using electron holography, phase reconstruction, and vector field electron tomography. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Characterization, Magnetic Materials, Modeling and Simulation |