| Abstract Scope |
Characterizing nanoscale structural and chemical changes using TEM techniques like S/TEM often involves collecting large, complex datasets. While modern instrumentation offers improved resolution and high quality analytical signal acquisition, it also amplifies challenges in data management and processing. To tackle this, new methods are emerging that streamline acquisition and analysis. Smart scanning techniques prioritize key regions of interest for detailed study using tools like EDS, EELS, and 4D-STEM. Simultaneously, on-the-fly data processing enables real-time extraction of key features, such as phase distribution and morphology, minimizing post-acquisition workloads. Enhanced hardware-software integration and flexible scripting further support customized, automated workflows. This presentation will highlight recent progress in these smart acquisition strategies and explore the ongoing challenges in fully realizing their potential for high-throughput, nanoscale materials analysis. |