About this Abstract |
| Meeting |
2027 TMS Annual Meeting & Exhibition
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| Symposium
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Four-Dimensional Scanning Transmission Electron Microscopy (4D STEM) for Quantitative Materials Characterization
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| Presentation Title |
Efficient Three-Dimensional Imaging with Phase-Contrast 4D-STEM |
| Author(s) |
Steven E. Zeltmann |
| On-Site Speaker (Planned) |
Steven E. Zeltmann |
| Abstract Scope |
In 4D-STEM imaging, a converged electron probe is scanned across a sample while a pixelated detector records the full scattering distribution. Since the converged probe illuminates the sample from a range of directions simultaneously, the parallax effect encodes depth-sensitive information about the sample into the diffraction patterns. We have developed novel tilt- and aberration-correction algorithms for extracting this 3D information from both coherent and incoherent scattering processes, leading to highly dose-efficient 3D imaging from a single 4D-STEM dataset, which complement the time-consuming but physically complete iterative approaches. In this talk I will introduce the physics of this image formation process and the resulting limitations on resolution in 3D, and strategies for pushing towards improved depth sensitivity. I will demonstrate how the resulting reconstructions have yielded never-before-seen views of defects such as roughness, doping, and dislocations in functional materials, creating a powerful new tool for atomic scale imaging. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Characterization, Electronic Materials, Thin Films and Interfaces |