About this Abstract |
| Meeting |
2026 TMS Annual Meeting & Exhibition
|
| Symposium
|
Fracture and Deformation Across Length Scales: Celebrating the Legacy of William Gerberich
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| Presentation Title |
Nanoindentation Combined with In-Situ SPM Imaging, and Later with TEM Imaging |
| Author(s) |
Oden L. Warren |
| On-Site Speaker (Planned) |
Oden L. Warren |
| Abstract Scope |
Hysitron, Inc. (which eventually joined Bruker Corp.) had the good fortune of being located in the same metro as Prof. Gerberich. He was a bold researcher who relished the opportunity to be the first to take a prototype instrument out for a research spin. We very much appreciated him being our local nanoindentation expert and we miss him dearly. This presentation is intended to honor and memorialize Prof. Gerberich’s contributions to nanoindentation combined with in-situ SPM imaging, and later with TEM imaging. Hysitron was the first to commercialize a quantitative nanoindenter that could also acquire SPM images using the probe of the nanoindenter as the imaging stylus. The Gerberich group, together with Hysitron, published the initial paper based on this technology. Later, Hysitron developed a quantitative nanoindenter for TEM imaging simultaneous with nanoindentation. The Gerberich group did the initial research using the miniaturized, MEMS-version of this technology. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Mechanical Properties, Characterization, |