About this Abstract |
Meeting |
2022 Annual International Solid Freeform Fabrication Symposium (SFF Symp 2022)
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Symposium
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2022 Annual International Solid Freeform Fabrication Symposium (SFF Symp 2022)
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Presentation Title |
X-ray Tomography as a 3D Metrology Technique for AM Materials |
Author(s) |
Bryan K. Hunter, Erica Jacobson, Ian Cummings, Adam Wachtor, Brian Patterson |
On-Site Speaker (Planned) |
Bryan K. Hunter |
Abstract Scope |
Although metal AM produces parts faster and easier, the printing process often produces defects (pores and surface roughness) that undermine the part’s mechanical properties. We will use X-ray CT to assess print quality through void measurement (size and distribution) as well as gross dimensional accuracy and printed surface roughness. The STL file becomes the ground truth from which all 3D measures can be quantified. In comparison to line-of-sight surface measurement techniques, our developed method can interrogate inner and outer surfaces, which allows for a more encompassing measurement of surface roughness. From this, we can determine the optimal printing parameters to minimize defects within parts to optimize mechanical performance. We are investigating the minimum feature size that can be measured with X-ray CT as a comparison with the in situ quality control measurements, ultrasonic, thermal, acoustic and optical sensing measurements acquired during the printing process.
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Proceedings Inclusion? |
Definite: Post-meeting proceedings |