About this Abstract |
| Meeting |
MS&T25: Materials Science & Technology
|
| Symposium
|
Materials Informatics for Images and Multi-Dimensional Datasets
|
| Presentation Title |
Application of a Linear Homography Based approach for absolute residual strain extraction from Electron Backscatter Diffraction Patterns |
| Author(s) |
Crestienne Alexandra Dechaine, Marc De Graef |
| On-Site Speaker (Planned) |
Crestienne Alexandra Dechaine |
| Abstract Scope |
We report on a novel method for the quantification of residual strain from high-resolution electron backscatter diffraction (EBSD) images using a dictionary-based approach coupled with a linear homography-based approach to extract a deformation gradient tensor from the Kikuchi patterns. The initial algorithm validation was performed using an EBSD data set collected on polycrystalline 316L SS steel that was subjected to tensile loading. The results were then compared with the more conventional High-Resolution Electron Backscatter Approach (HR-EBSD) implemented in OpenXY. The novel algorithm will then be applied to additively manufactured (AM) 316 L SS, whose complex microstructure limits the use of the conventional HR-EBSD technique. The determination of absolute residual strain distributions in AM parts is essential for understanding the influence of manufacturing parameters on thermal shrinkage and expansion in a constrained geometry. The novel method aims to enable the quantification of residual stresses in AM parts via EBSD. |