About this Abstract |
| Meeting |
2026 TMS Annual Meeting & Exhibition
|
| Symposium
|
Advanced Characterization Techniques for Quantifying and Modeling Deformation
|
| Presentation Title |
Unexpected Dislocation Patterning Under [100] Tension Revealed by DFXM and CDD Modeling |
| Author(s) |
Adam Cretton, Felix Frankus, Henning Friis Poulsen, Grethe Winther, Can Yildirim, Carsten Detlefs, Albert Zelenika, Khaled Abdelaziz, Anter El-Azab |
| On-Site Speaker (Planned) |
Adam Cretton |
| Abstract Scope |
We investigate dislocation patterning in high-purity aluminium single crystals deformed along the [100] axis using Dark Field X-ray Microscopy (DFXM). This synchrotron-based technique uniquely enables non-destructive mapping of deeply embedded layers in bulk samples, probing the local microstructure and strain in volumes up to millimetre size. At approximately 5% tensile strain, extended boundaries aligned with {111} planes are observed to form before the appearance of dislocation cells. This is unexpected for this orientation and suggests that interactions between dislocations on coplanar slip systems may reduce the effective slip symmetry. To investigate this, we compare the experimental results to a continuum dislocation dynamics simulation of [100]-tensile deformed nickel, chosen for its similar patterning behaviour. Synthetic DFXM contrast is computed from the simulation to allow direct visual comparison. This enables the first direct, one-to-one comparison between experimental and simulated DFXM data, providing a framework for testing dislocation patterning models at the mesoscale. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Aluminum, |