About this Abstract |
| Meeting |
2027 TMS Annual Meeting & Exhibition
|
| Symposium
|
Microstructure-Sensitive Design and Advanced Characterization: An MPMD/SMD Symposium Honoring David T. Fullwood
|
| Presentation Title |
A brief history of MSD and HREBSD |
| Author(s) |
David T. Fullwood |
| On-Site Speaker (Planned) |
David T. Fullwood |
| Abstract Scope |
This presentation looks back through 20+ years of microstructure sensitive design (MSD) and electron backscatter diffraction (EBSD) characterization of metals. It reflects on the mathematical tools that enabled efficient searching for optimal microstructures, and what that means in the era of artificial intelligence. It also reviews the rise of high-resolution EBSD (HREBSD) for mapping strain and geometrically necessary dislocations within metallic microstructures. Recent applications include forming techniques that extend ductility of sheet metals via continuous bending under tension (CBT); a range of different behaviors are observed, including in the retained ductility present following forming operations. A roadmap for potential future developments in MSD and HREBSD is explored. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Characterization, Modeling and Simulation, |