About this Abstract |
| Meeting |
2026 TMS Annual Meeting & Exhibition
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| Symposium
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Fundamental Science of Microstructural Evolution and Phase Transformations: An MPMD/FMD/SMD Symposium in Honor of Peter Voorhees
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| Presentation Title |
In-situ Characterization of Grain Growth in Fine-Grained Alumina Using Scanning Three-Dimensional X-ray Diffraction |
| Author(s) |
Wenxi Li, Jonathan Wright, Hemant Sharma, Marcel Chlupsa, ZiPeng Xu, Veera Sundararaghavan, Ashley Bucsek |
| On-Site Speaker (Planned) |
Wenxi Li |
| Abstract Scope |
Grain growth control in fine-grained alumina is essential for optimizing its optical and mechanical properties in advanced ceramic applications. In-situ scanning three-dimensional X-ray diffraction (scanning 3DXRD) was performed at 1300 °C to investigate grain growth behavior in fine-grained alumina, with X-ray fluorescence (XRF) used to map the distribution of zirconia and yttria dopants. Intragranular orientation and elastic strain were resolved, providing direct insight into local grain responses during annealing. Grain boundary (GB) morphology and positions were tracked across sequential heat treatments, enabling quantification of boundary curvature and migration velocity. By analyzing triple junction geometry and evolution, we estimated relative grain boundary energies. Grain boundary curvature, velocity, and relative energy were evaluated in relation to the five-dimensional grain boundary character distribution (GBCD). These measurements reveal the influence of dopants on GB mobility and the roles of strain and boundary character in governing GB motion—advancing understanding of microstructural evolution in fine-grained ceramics. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Ceramics, Characterization, |