About this Abstract |
| Meeting |
2026 TMS Annual Meeting & Exhibition
|
| Symposium
|
Material Responses Investigated Through Novel In-Situ Experiments and Modeling
|
| Presentation Title |
Thermal Conductivity Measurement of a Thin Layer of the Single Crystals of β Phase Lead Oxide Using Time Domain Thermoreflectance (TDTR) Technique |
| Author(s) |
Sagar Kumar Verma, Sieun Chae, Nirmala Kandadai |
| On-Site Speaker (Planned) |
Sagar Kumar Verma |
| Abstract Scope |
Thin film of the single crystal lead oxide (PbO) is one of the new age p-type semiconductor material that has various promising properties like chemically stable, wide band gap and with variable crystallinity as per the application requirement. This has a large potential to create technological advancements in various fields of transducers, sensors, actuators, and energy storage due to their giant piezoelectric coefficient. However, the thermal properties of thin film single crystal structures vary significantly from bulk and are dependent on various parameters such as growth technique, substrate orientation, etc. In this work, through plane thermal properties of the single crystals of β-phase PbO thin film grown on MgO [100] substrate using molecular beam epitaxy (MBE) were investigated using a pump and probe technique called time domain thermoreflectance (TDTR). The estimated values of the through-plane thermal conductivity is 1.9 Wm−1K−1. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Additive Manufacturing, Characterization, Aluminum |