| Abstract Scope |
Complex permittivity is a fundamental material property. In a parallel plate capacitor, the complex permittivity—also called the dielectric constant—determines the capacitance for a given geometry. Despite its importance in circuit design and ultimately device performance, complex permittivity measurements are nontrivial. Depending on the material formfactor (e.g., thin film vs. substrate, isotropic vs. anisotropic, etc.) and the end use, there may or may not be a measurement solution. Regardless of the chosen solution, the problem with every measurement is that there is no standard for complex permittivity. Making a standard reference material for complex permittivity is very difficult because it requires an unbroken chain of measurements with uncertainties that trace to the International System of Units (SI). Each of these uncertainties must be appropriately small and accounted for in an uncertainty budget. In this talk, I will walk through our new standard for complex permittivity to 80 GHz and our path to 350 GHz. |