About this Abstract |
| Meeting |
2026 TMS Annual Meeting & Exhibition
|
| Symposium
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Advanced Characterization Techniques for Quantifying and Modeling Deformation
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| Presentation Title |
Local Deformation Mapping: High-Resolution over Large-Area Characterization of Deformation of Microstructures |
| Author(s) |
Jan Schroers, Michael Aderibigbe, Yi-Xiang Yang, Arindam Raj, Sungwoo Sohn |
| On-Site Speaker (Planned) |
Jan Schroers |
| Abstract Scope |
Understanding and quantifying microstructure–property relationships, particularly those governing plastic deformation, remains the grand challenge in metallurgy. While existing techniques often tradeoff between spatial resolution, sampling area, and throughput, a method capable of bridging these scales has remained elusive. To address this need, we propose local deformation mapping (LDM) as a high-resolution, high-throughput mechanical characterization technique. LDM probes microstructures with ~10 nm² resolution across macroscopic areas, ~cm², generating up to ~10¹² data points in a single experiment. It maps deformation-related properties such as diffusivity as a function of microstructural features including grains, grain boundaries, and phase boundaries, hence revealing their impact on local plastic response. In a one-shot measurement we can determine the misorientation angle dependence of GB diffusivity and interphase diffusivities within the microstructure. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Characterization, Machine Learning, |