About this Abstract |
Meeting |
2025 TMS Annual Meeting & Exhibition
|
Symposium
|
Advanced Characterization Techniques for Quantifying and Modeling Deformation
|
Presentation Title |
A Polycrystalline X-Ray Virtual Diffractometer for Direct Comparisons to Experimental Data |
Author(s) |
Sven E. Gustafson, Paul Dawson, Matthew Miller, Kelly Nygren |
On-Site Speaker (Planned) |
Sven E. Gustafson |
Abstract Scope |
The advancement of synchrotron x-ray detectors, techniques, and reconstruction algorithms have realized the ability to compare grain-scale metrics from experimental reconstructions to those calculated via mechanical modeling. However, the x-ray techniques that allow fast interrogation of a sample’s grain-scale mechanical state measure all x-rays from a grain in convoluted diffraction events, which prevents easy reconstruction of spatially-resolved sub-granular fields. A finite element based virtual diffractometer is presented to produce realistic diffraction patterns from model generated microstructures with sub-granular resolution for direct comparison to detector images. To facilitate this comparison, simulation of the entire diffraction experiment is completed via a spatially-resolved incident x-ray beam, a virtual microstructure, and a pixelated detector. The functionality of the virtual diffractometer is demonstrated via direct comparisons between experimental and synthetic detector data. Additionally, we quantify the effects beam divergence, monochromatization, and detector spatial resolution on the resolution of reconstructed parameters (orientation, position, and elastic strain). |
Proceedings Inclusion? |
Planned: |
Keywords |
Other, Modeling and Simulation, ICME |