About this Abstract |
| Meeting |
2026 TMS Annual Meeting & Exhibition
|
| Symposium
|
Materials Kinetics and Mechanisms Under External Forcing-Driven Conditions
|
| Presentation Title |
Modeling the Impact of Radiation Damage on Laser Diode Performance |
| Author(s) |
Stephen Fluckey, Henry Little, Sijay Huang, Yu Leng, Christopher Singh, Xiang-Yang (Ben) Liu, Christopher Matthews, Blas P. Uberuaga |
| On-Site Speaker (Planned) |
Blas P. Uberuaga |
| Abstract Scope |
The development of radiation-hard optoelectronic devices begins with a fundamental understanding of how radiation-induced defects impact device performance. To that end, we have developed a multiscale model that uses defect thermokinetic data to parameterize a cluster dynamics model of damage, accounting for the local electronic structure of the material. The results of these simulations inform a device level model of a laser diode to assess the impact of those defects on the performance of the device. This model accounts for the confinement of the electromagnetic waves and the non-radiative recombination pathways introduced by the defects. With this model, we can ascertain the impact of individual defects on performance, suggesting a path to designing devices that are more resilient to irradiation. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Electronic Materials, Modeling and Simulation, Other |