About this Abstract |
| Meeting |
2027 TMS Annual Meeting & Exhibition
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| Symposium
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Four-Dimensional Scanning Transmission Electron Microscopy (4D STEM) for Quantitative Materials Characterization
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| Presentation Title |
STEMx Precession: a new tool for precession-assisted 4D STEM acquisition in DigitalMicrograph |
| Author(s) |
Fernando Cuauhtli Castro |
| On-Site Speaker (Planned) |
Fernando Cuauhtli Castro |
| Abstract Scope |
High-quality diffraction patterns are essential for accurate 4D STEM analysis when using techniques like strain and orientation mapping, but pattern quality is often degraded by common dynamical diffraction effects. Utilizing precession diffraction methods for 4D STEM benefits data quality by minimizing dynamical effects and improving signal-to-noise.
This abstract introduces STEMx Precession, a software-only method for acquiring precession-assisted 4D STEM data directly in DigitalMicrograph. STEMx Precession utilizes a sequential-tilting approach where the beam is tilted and rotated across discrete azimuthal angle positions. A 4D STEM dataset is acquired at each position, and all intermediate datasets are aligned and then summed to yield the final precession-assisted dataset.
Precession-assisted 4D STEM benefits multiple analyses, e.g. improved strain mapping precision and higher confidence indexing for orientation mapping. When combined with energy filtering, precession-assisted 4D STEM gives very high-quality diffraction data that will benefit a wide range of materials systems and applications. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Characterization, |