About this Abstract |
| Meeting |
2026 TMS Annual Meeting & Exhibition
|
| Symposium
|
Fracture and Deformation Across Length Scales: Celebrating the Legacy of William Gerberich
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| Presentation Title |
Revealing the line-defect-based mechanisms of deformation-induced martensitic transformations |
| Author(s) |
Ryan Sills, Xiaowang Zhou, Douglas Medlin |
| On-Site Speaker (Planned) |
Ryan Sills |
| Abstract Scope |
Deformation-induced martensitic transformations are an essential aspect of advanced TRIP alloys, while also being a classical problem in physical metallurgy harking back to the beginning of Bill Gerberich’s academic career. And yet, the specific line defect mechanisms underlying these transformations have yet to be revealed in detail. In this talk, we use a recently developed technique for identifying interfacial line defects in atomistic simulations to unambiguously identify line-defect-mediated mechanisms. Taking 300-series stainless steels as an exemplar, we observe two different cases of martensitic transformations at slip band intersections that agree with experiments: FCC austenite reversion and BCC alpha’-martensite formation. We show that in both cases the transformations proceed via nucleation and expansion of line defect loops (partial dislocations and disconnections) in conjunction with atomic shuffle. This finding contradicts the prevailing view, based on work of Olson and Cohen, that transformation is due to slip transmission at the slip band intersection. |
| Proceedings Inclusion? |
Planned: |