About this Abstract |
| Meeting |
2026 TMS Annual Meeting & Exhibition
|
| Symposium
|
Characterization of Minerals, Metals and Materials 2026 - In-Situ Characterization Techniques
|
| Presentation Title |
Revealing strain localization using differential micrograph imaging (DMI) |
| Author(s) |
Kelvin Yu Xuan Xie, Connor Lopez |
| On-Site Speaker (Planned) |
Kelvin Yu Xuan Xie |
| Abstract Scope |
Visualizing strain localization in materials during plastic deformation is an important process for failure analysis and further microstructural investigation. Traditional 2D Digital Image Correlation (DIC) is commonly used for measuring local displacement and strain fields of uniaxial strain tests but typically lacks the ability to capture deformation associated with grain boundaries. Here, we present a qualitative alternative to traditional DIC called Differential Micrograph Imaging (DMI) that can visualize deformation at grain boundaries at global strains as low as 0.2%. This technique utilizes dark-field optical imaging and commercially available image alignment software, such as ORB, SIFT, and ECC, to produce heatmaps of changing pixel intensity that capture deformation at or near grain boundaries with a resolution only limited by the imaging equipment. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Characterization, Magnesium, |