About this Abstract |
| Meeting |
2026 TMS Annual Meeting & Exhibition
|
| Symposium
|
Material Responses Investigated Through Novel In-Situ Experiments and Modeling
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| Presentation Title |
Investigating Subgrain Growth During Early-Stage Recrystallization in High-Purity Aluminum With In-Situ EBSD |
| Author(s) |
Zehua Liu, Marc De Graef |
| On-Site Speaker (Planned) |
Zehua Liu |
| Abstract Scope |
Subgrain growth in high-purity aluminum during early-stage recrystallization was investigated. Utilizing dictionary indexing and orientation similarity mapping, the subgrain growth process was clearly revealed through in situ low-voltage Electron Backscatter Diffraction (EBSD) experiments. Electron Channeling Contrast Imaging (ECCI) provided additional insights, confirming both small subgrains and rapidly growing large subgrains within partially recrystallized grains. High-resolution mapping allowed detailed observation of strain field evolution and grain boundary migration dynamics during recrystallization. Additionally, the growth dynamics of subgrains and the emergence of persistent island grains were explicitly tracked. Findings suggest that the formation and persistence of these island grains are associated with specific Coincident Site Lattice (CSL) boundaries formed upon interaction with particular regions of the deformed matrix. The type of CSL boundary might influence the survival and stability of island grains during recrystallization. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Characterization, Aluminum, |