| About this Abstract |
| Meeting |
2023 TMS Annual Meeting & Exhibition
|
| Symposium
|
Nanostructured Materials in Extreme Environments
|
| Presentation Title |
Dislocation Cells in Additively Manufactured Metallic Alloys Characterized by Electron Backscatter Diffraction Pattern Sharpness |
| Author(s) |
Fulin Wang, Jean-Charles Stinville, Marie Charpagne, McLean Echlin, Sean Agnew, Tresa Pollock, Marc De Graef, Daniel S. Gianola |
| On-Site Speaker (Planned) |
Daniel S. Gianola |
| Abstract Scope |
Additively manufactured metallic alloys often host hierarchical microstructures with crystalline grains that exhibit many morphologies and textures, along with sub-grain crystalline defect structures. These multiscale features act in concert to control mechanical behavior, yet are challenging to characterize using a single technique. Here, we quantify the sharpness of electron back-scattered diffraction patterns obtained from several additively manufactured metallic alloys, which reveals the sub-grain dislocation structure with high fidelity. We demonstrate that pattern sharpness reflects the heterogeneous elastic strain field from dislocations, and exhibits advantageous qualities for single-technique multiscale materials characterization, including an insensitivity to grain orientation, a value that is proportional to dislocation density, and an inherent ability to correlate with crystal orientation and strain obtained using electron back scattered diffraction. Our results demonstrate that the dislocation cell walls produced during fast solidification do not always possess measurable misorientations, and thus do not reflect a geometrically necessary defect organization. |
| Proceedings Inclusion? |
Planned: |