| About this Abstract |
| Meeting |
TMS Specialty Congress 2025
|
| Symposium
|
The 7th International Congress on 3D Materials Science (3DMS 2025)
|
| Presentation Title |
Closed-Form Solution for the Deformation Gradient Tensor in Dark Field X-Ray Microscopy |
| Author(s) |
Brinthan Kanesalingam, Darshan Chalise, Carsten Detlefs, Leora Dresselhaus-Marais |
| On-Site Speaker (Planned) |
Brinthan Kanesalingam |
| Abstract Scope |
Spatially resolved strain measurements are crucial for understanding material properties and phenomena that induce strain and lattice rotations. Dark Field X-ray Microscopy (DFXM) offers a unique opportunity with its ability to image bulk crystals at the nanoscale while providing a field-of-view approaching a few hundred micrometers. However, an inverse modeling framework to relate DFXM observables to strain and lattice rotation tensors has not been previously developed. By utilizing the oblique diffraction geometry for DFXM, which enables access to non-coplanar symmetry-equivalent reflections, we demonstrate that the reconstruction of the full deformation gradient tensor, and consequently the strain and lattice rotations, is analytically solvable in closed form. We developed a computational framework to both forward calculate the anticipated angular shifts and reconstruct the average deformation gradient tensor for individual pixels from DFXM experiments. This comprehensive approach will enable precise interpretation of existing DFXM data and guide the design of future DFXM experiments. |
| Proceedings Inclusion? |
Undecided |