About this Abstract |
| Meeting |
2027 TMS Annual Meeting & Exhibition
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| Symposium
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Four-Dimensional Scanning Transmission Electron Microscopy (4D STEM) for Quantitative Materials Characterization
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| Presentation Title |
Interfacial structure–property relationships in Cu/Nb and Ti/Nb nanolaminates via high-throughput neural object detection 4D-STEM |
| Author(s) |
Mauricio De Leo, Arda Genc, Nicolas Fuchs-Lynch, Benjamin Derby, Daniel Gianola, Irene Beyerlein, Nathan Mara |
| On-Site Speaker (Planned) |
Mauricio De Leo |
| Abstract Scope |
Metallic nanolaminates containing three-dimensional interfaces (3DIs), where composition and crystal structure vary in all three dimensions, outperform their sharp 2D counterparts, yet the 3DI structure responsible for this mechanical enhancement is poorly understood. Orientation relationships in these systems are established macroscopically from pole figures, but local interface strain and the crystallography at any individual interface remain uncharacterized. We apply a high-throughput framework pairing YOLO-based sub-pixel Bragg disk detection with CIF-driven template indexing, to 4D-STEM datasets from Cu/Nb and Ti/Nb nanolaminates containing 3DIs, returning correlated phase, chemistry, orientation, and strain maps through the 3DI. Cu/Nb and Ti/Nb form structurally distinct interfaces where FCC/BCC Cu/Nb 3Dis have amorphous interfacial zones and HCP/BCC Ti/Nb 3DIs are fully crystalline, yet both architectures enhance strength and deformability as scoped through nanoindentation and micropillar compression studies. We identify the interfacial features common to 3DI-enabled mechanical response enhancement between these divergent microstructures. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Thin Films and Interfaces, Characterization, Mechanical Properties |