About this Abstract |
| Meeting |
2026 TMS Annual Meeting & Exhibition
|
| Symposium
|
Characterization of Minerals, Metals and Materials 2026 - In-Situ Characterization Techniques
|
| Presentation Title |
Mapping Electric Fields and Charge Densities in Electroceramics Using 4D Scanning Transmission Electron Microscopy |
| Author(s) |
Sangjun Kang, Hyeyoung Cho, Di Wang, Christian Kuebel |
| On-Site Speaker (Planned) |
Christian Kuebel |
| Abstract Scope |
Polycrystalline BaTiO₃ and SrTiO₃ are widely used in ceramic capacitors for their high dielectric performance, yet they degrade under thermal and voltage stress due to oxygen vacancy migration and grain boundary accumulation. Understanding space charge regions (SCRs) at grain boundaries is critical to improving device reliability. We present an advanced 4D-STEM-based electromagnetic field mapping technique for polycrystalline ceramics, integrating electron beam precession to minimize diffraction contrast artifacts and applying Sobel edge detection with SVD-based refinement for high-precision field extraction. This approach overcomes limitations of traditional methods like phase wrapping and orientation artifact. Combined with in-situ biasing TEM, we visualize SCR evolution under different thermal and electrical stresses. Our methodology enables accurate field mapping in heterogeneous polycrystalline materials and offers new insights into degradation mechanisms in doped titanate ceramics. These findings contribute to broader applications of in-situ 4D-STEM in functional ceramics and support the development of more resilient capacitor materials. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Characterization, Thin Films and Interfaces, Ceramics |