About this Abstract |
Meeting |
2023 TMS Annual Meeting & Exhibition
|
Symposium
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Neutron and X-ray Scattering in Materials Science
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Presentation Title |
Determination of Residual Stress and Strain Fields during Cold Expansion Processing Using Complementary Diffraction Techniques |
Author(s) |
Nicholas Bachus, Donald Brown, Christopher Budrow, Bjørn Clausen, J.Y. Peter Ko, Kelly Nygren, Renan Ribeiro, Michael Hill |
On-Site Speaker (Planned) |
Nicholas Bachus |
Abstract Scope |
Synchrotron X-ray and time-of-flight neutron diffraction measurements are used to determine elastic residual strain and stress fields in the vicinity of geometrically large holes in 7050-T7451 aluminum plate samples caused by cold expansion (Cx) processing. The measurements are relevant because Cx is widely used in the aircraft industry to improve the fatigue resistance of critical components containing fastener holes. Recent model development reveals a large discrepancy between computed and measured residual stress fields. The Los Alamos SMARTS and Cornell FAST diffractometers are used to determine the residual stress and strain fields in partially (50%) and fully (100%) processed samples. Consistent strain trends are observed in both samples for the two types of measurements, with the datasets being complementary: neutrons offering determination of stress, and X-rays revealing fine spatial variations of strain. Together these data provide opportunities for improving process models of Cx. |
Proceedings Inclusion? |
Planned: |
Keywords |
Aluminum, Mechanical Properties, Other |