About this Abstract |
| Meeting |
2027 TMS Annual Meeting & Exhibition
|
| Symposium
|
Photomechanical and Electromechanical Effects in Structural and Functional Materials
|
| Presentation Title |
Interplay Among Strain, Mobile Ions, and Reliability in Metal Halide Perovskite Photovoltaics |
| Author(s) |
Nick Rolston |
| On-Site Speaker (Planned) |
Nick Rolston |
| Abstract Scope |
Ion migration is a major degradation pathway in metal halide perovskite (MHP) optoelectronic devices. It is known that defects drive ion migration, and thus, effective defect passivation, including additive engineering, mitigate degradation. Independently, strain in MHP thin films—whether residual, stimulus-induced, or a combination of the two—has been identified as another factor influencing the stability of MHP materials and devices. This work targets the following knowledge gap: is the amount and direction of strain (tensile or compressive) an independent accelerator that directly leads to MHP degradation under stimuli, or does it serve as a mediator—i.e., promoting or suppressing defect formation—thereby influencing mobile ion formation? Unraveling this fundamental strain-stimulus-defect-mobile ion relationship is not only novel but also necessary for durable, high-performance MHP materials and devices. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Energy Conversion and Storage, Mechanical Properties, Electronic Materials |