About this Abstract |
| Meeting |
2026 TMS Annual Meeting & Exhibition
|
| Symposium
|
Characterization of Minerals, Metals and Materials 2026 - In-Situ Characterization Techniques
|
| Presentation Title |
Applications of Hitachi 4000Plus Broad Beam Polish for High Resolution Electron Back Scattered Diffraction |
| Author(s) |
Lucero Lopez |
| On-Site Speaker (Planned) |
Lucero Lopez |
| Abstract Scope |
Electron Back Scattered Diffraction is a widely utilized microscopy technique in Material Science and Engineering for material characterization. For In Situ tensile experiments using High Resolution Electron Back Scattered Diffraction requires a high surface finish because as the crystal undergoes plastic deformation the lattice loses periodicity, the image loses confidence index in matching the proposed solution. The deformation in the crystal scatters the image and disturbs the resolution of the EBSD scan. For particularly difficult metals like Magnesium, the broad beam polisher as a final step can bridge the gap for higher surface finish for HREBSD. In this experiment, the Hitachi 4000Plus Broad Beam Polisher to maximize the surface finish for HREBSD and verifying the surface roughness using a Bruker DektaXT Profilometer to compare before and after results. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Characterization, |