| Abstract Scope |
The formation of percolation networks in inkjet-printed metallic nanoparticle films fundamentally determines their electrical performance in printed electronics. This research employs COMSOL Multiphysics to model current distribution pathways within these networks, examining how measurement geometry affects electrical property interpretation. By simulating coalescence of deposited droplets into continuous films, realistic percolation network geometries are generated for electrical transport modeling. COMSOL simulations map current density distributions under both van der Pauw and four-point collinear probe configurations, revealing how current pathways redistribute based on probe placement, film roughness, and network connectivity. This integrated modeling approach provides insights into how measurement artifacts, edge effects, and local heterogeneities influence conductivity values and percolation threshold determination. The framework extends to various conductive inks including gold, silver, copper, and nickel, offering predictive capabilities for optimizing surface roughness characteristics and measurement protocols. This work advances understanding of electrical transport in printed nanoparticle films and provides guidelines for accurate characterization of inkjet-printed electronics. |