About this Abstract |
| Meeting |
MS&T25: Materials Science & Technology
|
| Symposium
|
Advances in Dielectric Materials and Electronic Devices
|
| Presentation Title |
Investigation of the structural properties and dielectric relaxation processes in NBT–KBT based lead-free ceramics |
| Author(s) |
Marcos Aparecido dos Santos Mariano, José Eduardo Garcia, Ruyan Guo, Amar Bhalla, José de los Santos Guerra |
| On-Site Speaker (Planned) |
Marcos Aparecido dos Santos Mariano |
| Abstract Scope |
In this work, lead-free ferroelectric ceramic samples based on the Na0.5Bi0.5TiO3–K0.5Bi0.5TiO3 (NKBT) solid-solution were obtained by the solid-state reaction sintering method. The physical properties were explored considering the influence of the Sn4+ concentration, when inserted in the B-site of the NKBT perovskite structure. In particular, the structural characteristics and dielectric relaxation processes have been investigated from the X-ray diffraction technique and dielectric analysis, respectively. Results revealed strong influence of the doping content on both structural and dielectric parameters, in particular in the activation energy associated with the observed relaxation processes. The obtained results are discussed within the framework of current models reported in the literature for dielectric relaxation processes. ACKNOWLEDGMENTS: The authors thank to CNPq (309494/2022-2 and 408662/2023-9), FAPEMIG (APQ-02875-18) and CAPES (Finance Code 001) for the financial support. |